01483nas a2200181   4500008004100000022001300041245013500054210006900189260001600258300001400274490000700288520069800295100001600993700002101009700001701030700002401047856023001071       2005                        eng d  a0927024800aCharacterization of electrical properties and photosensitivity of SnS thin films prepared by the electrochemical deposition method0 aCharacterization of electrical properties and photosensitivity o  cJan-01-2005  a153 - 1650 v853 aUsing the electrochemical deposition (ECD) method, we prepared tin sulfide thin films, which are suitable for the absorption layer in solar cells because of its bandgap energy (∼1 eV). We first optimized pulse-form biasing for ECD by characterizing deposited samples with scanning electron microscope, Auger electron spectroscopy and X-ray diffraction measurements. Then, we investigated the electrical properties of deposited SnS thin films and the properties of contacts with several different metals. Furthermore, we observed the photoconductivity of the films by means of photoelectrochemical measurements. From these results, we confirmed that the SnS thin films show p-type conduction.1 aSato, Naoya1 aIchimura, Masaya1 aArai, Eisuke1 aYamazaki, Yoshihisa  uhttp://linkinghub.elsevier.com/retrieve/pii/S0927024804002077http://api.elsevier.com/content/article/PII:S0927024804002077?httpAccept=text/xmlhttp://api.elsevier.com/content/article/PII:S0927024804002077?httpAccept=text/plain